This important new methodologically-oriented work represents a major step forward in the expanding field of traceological studies. . . . The text is exceptionally well written and documented. Schematic artifacts line drawings . . . clearly indicate different use zones on edges and are preceded by a coded use-type key. The 280 x photomicrographs in section III are exceptional as is also the presentation of qualitative and quantitative data.
Vaughan's monograph provides a thorough treatment of the high-power microscopic approach to lithic use-wear analysis and will contribute to the resolution of this issue. . . . An excellent introduction to the subject.
—North American Archaeologist